Application-Specific Software

Premium Software

Licensed Software

This software includes a USB security dongle. The software may be installed on as many PCs as you like, but only copy can be run at a time.

LCDView

LCDView™ is an industry leading software package that is used for direct simultaneous non-contact measurement of the internal structure of liquid crystal cells within liquid crystal displays (LCDs), liquid crystal on silicon displays (LCOS), and polymerized LC films. These physical properties include Cell Gap, Rubbing/Alignment direction, Twist Angle, and Pre-tilt angles  on both surfaces (input and output).

Using AxoScan Mueller matrix measurements at multiple tilt angles, LCDView can directly measure all the physical properties of all known types of liquid crystal cells, including: vertically aligned (VA), twisted nematic (TN), super-twisted nematic (STN), parallel rubbed (OCB, etc.) and anti-parallel rubbed (IPS, FFS, etc.). Additionally, using AxoStep image data the parameters inside individual multi-domain pixels (PSVA, UV2A, etc.) can be measured.

Features include:

• Proprietary twist modeling
• Dispersion modeling
• Tilt correction
• Forward simulation
• ECT modeling
• Batch processing
• Color filter compensation

Applications:

• Transmissive LCD panels
• Transflective LCD panels
• Reflective LCOS panels
• LC test cells

Multi-Layer Analysis Software Package (MLSP)

MLSP™ is used to determine the parameters of individual layers in complex multi-layered optical components. MLSP was designed specifically for use in testing compensated polarizer films for use in the display industry and it is the only software package on the market that can measure the optical properties of retarder films that are laminated to polarizer films.

MLSP was developed with versatility in mind, which has allowed it to demonstrate its usefulness in testing a wide array of optical components like circular polarizers and liquid crystal films.

Features include:

• Support for compound Retarder and Polarizer samples
• Support for Splayed and twisted materials
• Up to 5 individual optical element layers
• Support for industry standard specifications like R0, and Rth of compensation films

Common applications:

• Determine the polarizer axis, retarder axis, and retardance of the elements of assembled circular polarizers
• Determine the retardance axes and magnitudes of multi-element achromatic retarders
• Determine the R0, Rth, and orientation of field-of-view compensation films laminated to LCD polarizers

EllipsoView

EllipoView™ acquires ellipsometric data and calculates the thickness and refractive index (n and k) of thin-films or bulk materials by applying industry-standard ellipsometry models to Mueller matrix measurements made in reflection. Due to the nature of the Mueller matrix, when coupled with an AxoScan system, EllipsoView analysis can handle everything from the simplest to the most challenging samples:

Features include:

• Arbitrary number of isotropic or anisotropic layers
• Effective medium approximation for mixed materials, and graded index layers
• Works with both Ellipsometry and Mueller Matrix Data
• Access to Refractive index.com database of materials
• Multiple Dispersion Models including, Cauchy, Cauchy Ubrach, Selimeyer, Drude , Lorentz, Tauc Lorentz
• Depolarization data can be simulated with the multi‐wavelength and multi-angle partial coherence data analysis
• Batch analysis and image mapping support
• Supports measurement data from all Axometrics hardware (AxoScan, AxoStep, EllipsoStep)
• Supports Axometrics proprietary FMM method for anisotropic alignment

Applications:

• Standard thin films
• Thick films exceeding the coherence length of the light source
• Anisotropic films including photo-aligned PI
• Depolarization due to back surface reflections from transparent substrates